I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...

Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...

NORTH READING, Mass.--(BUSINESS WIRE)-- Teradyne, a leading provider of automated test equipment, has partnered with ficonTEC, a global leader in production solutions for photonics assembly and test, ...

LIVERMORE, Calif., Oct. 16, 2019 (GLOBE NEWSWIRE) -- FormFactor, Inc. (NASDAQ: FORM), an industry-leading electrical test and measurement supplier to the semiconductor industry, will showcase new ...

A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...

SANTA CLARA, Calif.--(BUSINESS WIRE)--What’s New: Intel, Bluefors* and Afore* have introduced the first cryoprober, a quantum testing device named the Cryogenic Wafer Prober, developed specifically to ...

SV Probe, a supplier of high-performance probe cards, has signed an agreement to purchase the assets of the wafer-test business of Kulicke & Soffa Industries, a supplier of semiconductor wire-bonding ...

New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...

Intel has announced a quantum testing device, called a cryoprober, that it said can measure quantum chips (qubits), and gather information in minutes on sources of quantum noise and the quality of ...

I’ve had a fairly varied early part of my career in the semiconductors business: a series of events caused me to jump disciplines a little bit, and after one such event, I landed in the test ...