Electronic Design

Third-Generation Serial Test Dos and Dont's

Tektronix's Chris Loberg covers what to do (and what NOT to do) in testing third-generation serial-data links. With the arrival of third-generation serial standards ...
Electronic Design

Third-Generation Serial Test Dos and Don’ts

With the arrival of third-generation serial standards, many of the rules around debug/verification and characterization/compliance test are changing. Here are some ...
EDN

Inside a high-power test fixture

Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...
Semiconductor Engineering

A Customized Low-Cost Approach For S-Parameter Validation Of ATE Test Fixtures

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...