The LF210 Laser Autofocus System from Prior Scientific is designed to improve microscopic examination of a wide range of reflective samples including semiconductor wafers and hard disc drive platens.
General Motors has been granted a patent for a system that inspects reflective surfaces using two imaging assemblies. The first captures depth information, while the second gathers contrast data. A ...
Metalenses represent a revolutionary advancement in optical technology. Unlike conventional microscope objectives that rely on curved glass surfaces, metalenses employ nanoscale structures to ...
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