The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the ...

Double-pulse testing will play a pivotal role in the future of power electronics. Power designers and system engineers rely on it to evaluate the switching characteristics of power semiconductors such ...

Enables accurate and safe measurement of floating circuits in high-voltage, noisy environments Provides superior rejection of high common-mode voltages and accompanying noise to isolate small, ...

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...

Struggling to test complex chips fast and at low cost? See how a compact air-cooled system increases speed, lowers cost, and ...

As newer devices operate at ever-escalating power levels, controlling temperature during test gets tougher. These challenges may be difficult, but some solutions are developing. Low-cost burn-in with ...

At the Applied Power Electronics Conference & Exposition (APEC 2025), celebrating its 40th year, over 300 exhibitors showcased their latest component advances for system power designers across a wide ...

This special series focuses on important community issues, innovative solutions to societal challenges, and people and non-profit groups making an impact through technology. by Lisa Stiffler on Nov 29 ...