AUSTIN, Texas--(BUSINESS WIRE)--The Silicon Integration Initiative Compact Model Coalition is proud to announce the release of the ASM-ESD diode model, a new electrostatic discharge compact modeling ...

We’ve all experienced the effect of electrostatic discharge at some point in our lives, the most common case being a tingling sensation one feels after touching a door knob or any metal surface. When ...

At our company, we used failure analysis (FA) to successfully determine what caused GaAs RF ICs to fail during retesting. In our case, the source of the damage turned out to be just as important as ...

An electronic device is susceptible to Electrostatic Discharge (ESD) damage during its entire life cycle, especially from the completion of the silicon wafer processing to when the device is assembled ...

This ESD model is one of the first used and attempts to model a human that has accumulated static charge and dissipates it onto the device under test. The setup for this test is a 100pF capacitor is ...

Standards for specifying a chip’s ability to withstand electrostatic discharge (ESD) are changing – in some cases, getting tougher, and in others, easing up. ESD protection has been on a path from a ...